基于ieee1149.4標(biāo)準(zhǔn)混合信號測試方法研究

1、分類號 密級 U D C 編號 桂 林 電 子 工 業(yè) 學(xué) 院 研 究 生 學(xué) 位 論 文 題目 題目 基于 基于 IEEE1149.4 標(biāo)準(zhǔn)混合信號測試方法研究 標(biāo)準(zhǔn)混合信號測試方法研究 (中英文) Research for

2、 Mixed-Signal Boundary Scan Test Method Based on Std IEEE1149.4 研 究 生 姓 名： 尹 愛 暉 指導(dǎo)教師姓名、 職務(wù)： 雷 加（副教授） 申 請 學(xué) 位： 工 學(xué) 碩 士 學(xué) 科、 專 業(yè)： 測試計量技術(shù)及儀器 提 交 論 文

3、日 期： 2005 年 4 月 論 文 答 辯 日 期： 2005 年 6 月 授 予 學(xué) 位 日 期： 年 月 日 摘要 IIABSTRACT The mixed-signal circuits are widely used in many integrated circuit systems.

4、The integration of circuit systems becomes very high with the rapid increases in the mixed-signal circuits. It is very difficult to test the high-integrated circuits using the traditional test methods. The test method

5、s are the key factor for the developing of mixed-signal circuits. So, it is very important to research the theory and application for the mixed-signal boundary-scan test. In this text, based on the IEEE1149.4 standard

6、, the boundary-scan test methods for the mixed-signal circuits are researched. According to the characters of mixed-signal and the structure of mixed-signal boundary-scan test system, different methods are used to test

7、 the different models of the mixed-signal circuits. It accomplishes the simple interconnect testing, extended interconnect testing and differential interconnect testing. The method of k-node fault testability and the te

8、st structure of IEEE1149.4 are combined to test the complicated passive circuits. In order to improve the test precision, the oscillation-test method based on Std IEEE1149.4 are used to test the active circuits. Accordin

9、g to the different test models, the analog boundary module (ABM) is extended to enhance the mixed-signal test. It is useful to research the extending application of Std IEEE1149.4. For the boundary scan test of mixed-si

10、gnal circuits, the test methods described in the text, have a widely application fields. From the practical test, in some extent, the test methods can solve the boundary scan test of mixed-signal circuits. Key words: Std